[1]
D. M. Tsai and C. T. Lin, “Fast Normalized Cross Correlation for Defect Detection,” Pattern Recognition Letters, Vol. 24, No. 15, 2003, pp. 2625-2631.
doi:10.1016/S0167-8655(03)00106-5
[2]
K. Tanaka, M. Sano, S. Ohara and M. Okudaira, “A Parametric Template Method and Its Application to Robust Matching,” Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, Hilton Head Island,13-15 June, 2000, pp. 620-627.
[3]
Y. H. Lin, C. H. Chen and C. C. Wei, “New Method for Subpixel Image Matching with Rotation Invariance by Combining the Parametric Template Method and the Ring Projection Transform Process,” Optical Engineering, Vol. 45, No. 6, 2006.
doi:10.1117/1.2213609
[4]
Y. H. Lin and C. H. Chen, “Template Matching Using the Parametric Template Vector with Translation, Rotation and Scale Invariance,” Pattern Recognition, Vol. 41, No. 7, 2008, pp. 2413-2421.
doi:10.1016/j.patcog.2008.01.017
[5]
M. Bukovec, Z. Spiclin, F. Pernus and B. Likar, “Automated Visual Inspection of Imprinted Pharmaceutical Tablets,” Measurement Science and Technology, Vol. 18, No. 9, 2007, pp. 2921-2930.
doi:10.1088/0957-0233/18/9/023
[6]
M. Bukovec, Z. Spiclin, F. Pernus and B. Likar, “Geometrical and Statistical Visual Inspection of Imprinted Tablets,” Proceedings of IAPR Conference on Machine Vision Applications, Tokyo, 16-18 May 2007, pp. 412-415.
[7]
M. Mozina, D. Tomazevic, F. Pernus and B. Likar, “Automated Visual Inspection of Imprint Quality of Pharmaceutical Tablets,” Machine Vision and Applications, Vol. 24, No. 1, 2013, pp. 63-73.
doi:10.1007/s00138-011-0366-4
[8]
I. T. Jolliffe, “Principal Component Analysis,” Springer, New York, 1986.
doi:10.1007/978-1-4757-1904-8
